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SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces 1
SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces 1

SATA Customized Chip High and Low Temperature Accelerated Aging Chamber 72 Pieces

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    Feature

    lSupport the customization of the number of SATA mass production test pieces, such as 30 pieces, 36 pieces, 42 pieces, 48 pieces, 54 pieces, 72 pieces, 100 pieces, 160 pieces, 200 pieces, etc.;

    lSupport research and development of micro-miniature customization, such as 6 pieces, 12 pieces, etc.;

    lSupport (-70°~+ 180°) test;

    lSupport abnormal power failure test and aging test;

    lSupport automatic temperature control test;

    lSupport all software for intelligent control testing;

    lSupport customization of test software;

    lSupport the balance of air speed and temperature in the box;

    lSupport rapid heating and cooling control;

    lSupport customized research and development of PCIE/EMMC/UFS/DRAM/Flash aging;

    lSupport network control, you can control the test in different places and view the test results;

    lSupport APP remote control testing;

    Information

    Model

    HD-72-SATA

    Inner box size

    W500×D400×H1020mm

    Outer box size

    About  W1250×D1350×H1910mm

    volume

    204L

    Opening method

    Single door (right open)

    cooling method

    air-cooled

    weight

    About 930KG

    power supply

    AC 220V    About 12KW

    Temperature parameter

    temperature range

    -70℃~150℃

    Temperature fluctuation

    ≤±0.5℃

    ≤±1℃

    temperature offset

    ≤±2℃

    temperature resolution

    0.01℃

    Heating rate

    5℃/min(mechanical cooling, under standard load)

    temperature change rate

    High temperature can meet 5~8/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0~2/min nonlinear

    Adjustable (measured at the air outlet, mechanical cooling, under normal load)

    temperature uniformity

    ≤±2℃

    standard load

    10KG aluminum block, 500W load;

    Test standard

    GB/T5170.2-2008 Temperature test equipment

     

    GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

     

    GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

     

    GJBl50.3 (MIL-STD-810D) high temperature test method.

     

    GJBl50.4 (MIL-STD-810D) low temperature test method.


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    You can also contact me via email. My email address is manager@qc-test.com
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    CONTACT PERSON :Mrs. Zhong
    TEL : +86-0769-8905 5588

    E-MAIL : manager@qc-test.com
    PHONE : +86-13602361535
    FACTORY ADD: No.13 Daxin Street, Daluosha Industrial Zone, Daojiao Town, Dongguan City, Guangdong Province.

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