Haida test equipment obtained certificate of new high-tech enterprise in 2019 Phone:+86-13602361535 E-mail:manager@qc-test.com
Portable Flash Memory Chip Intelligent Test System
Portable Flash Memory Chip Intelligent Test System
Product description:
The Smart Test System HD-N8-NAND is a comprehensive flash memory test system that can be customized to test up to 8 flash particles in parallel.
HD-N8-NAND supports a wide range of test patterns and customized test parameters. It provides a one-click basic test flow, highly flexible experimental test, and advanced test flow, and can It provides one-click basic test flow, highly flexible experimental test and advanced test flow, which can realize various functional tests such as remaining life prediction, the real test, data retention and read disturbance of flash memory particles. The test report can be exported quickly and easily after the completion of the test. It provides the most intuitive graphical test data to provide the most accurate reference for flash particle classification and application. It also provides the most accurate reference for flash particle classification and application and enables intelligent grading based on flash particle quality test results.
Technical specifications:
Physical properties | |
Equipment size | W400×H510×D520mm |
Power supply method | AC |
Operating voltage range | AC(220±10%)V single-phase 2-wire + protective earth |
Normal working power consumption | 2KW |
Operating temperature range | -30℃~150℃ |
Storage temperature range | -20℃~60℃ |
Operating Humidity Range | 45%~75% |
System performance | |
Number of particles that can be tested in parallel | 1~8 pcs |
Supported flash brands for testing | SLC, MLC, TLC, Sandisk, etc. from Micron, Intel, YMTC, Hynix, Toshiba, Sandisk, etc, QLC type NAND Flash chip particles (range is being extended) |
Package sizes supported | BGA152, BGA132 (custom extensions available) |
Supported Flash Protocol Types | ONFI/toggle interface particles |
Supported Voltage | Hardware support V1.2, V1.8 optional |
Supported Voltage Pull-Off Range | Software support can be fine-tuned vcc2.3~3.6 vccq1.2 1.15~1.25 vccq1.8 1.70~1.95 |
Supports optional test ranges | Individual settings for number of starting blocks, inter-block interval, number of cycles, test time, etc. |
Support pattern | All 0, all 1, all 5, pseudo-random, checkerboard grid, word line random, etc. |
Support for test command types | Flash Memory Information Inspection Flash Memory Performance Testing Life Testing and Prediction Quality Class Classification Data Interference Testing Data Retention Testing Read-Retry Functionality Lifetime Testing and Prediction ECC Customisation |
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CONTACT PERSON :Mrs. Zhong
TEL : +86-0769-8905 5588
E-MAIL : manager@qc-test.com
PHONE : +86-13602361535
FACTORY ADD: No.13 Daxin Street, Daluosha Industrial Zone, Daojiao Town, Dongguan City, Guangdong Province.
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