Climatic HAST High Pressure Accelerated Aging Tester For Semiconductor Chip

High Pressure Accelerated Aging Tester

Features:

1. The double-circuit structure of imported high-temperature resistant solenoid valves is adopted, which reduces the failure rate to the greatest extent.

2. Independent steam generating room, to avoid direct impact of steam on the product, so as not to cause local damage to the product.

3. The labor-saving structure of the door lock solves the disadvantages of the first generation of disc-type handles, which are difficult to lock.

4. Exhaust cold air before the test; the design of exhaust cold air during the test (the air in the test tank is discharged) improves pressure stability and repeatability.

5. Ultra-long-term experimental operation time, long-term experimental machine operation for 400 hours. 

6. Water level Protection, through the detection and protection of the water level sensor in the test room. 

7. Pressure-resistant design, the box can withstand a pressure (150°C) of 2.65kg, which meets the water pressure test of 6kg. 

8. Two-stage pressure safety protection device, using a two-stage combined control Device and mechanical pressure protection device. 

9. Safety protection pressure relief button, emergency safety device two-stage automatic pressure relief button. 

10. Bias test terminal withstand voltage up to 3000V (optional)

11. USB export history data curve